Biasing of Metal-Semiconductor Junctions
Electrical Conductivity
You might also read
Articles linked to this work by shared authors, journal, and citation graph.
Updated: Jul 31, 2025

Fabrication of Low Temperature Carbon Nanotube Vertical Interconnects Compatible with Semiconductor Technology
Published on: December 7, 2015
Maxence Menétrey1, Cathelijn van Nisselroy2, Mengjia Xu2
1Laboratory for Nanometallurgy, Department of Materials, ETH Zürich Vladimir-Prelog-Weg 1-5/10 8093 Zürich Switzerland ralph.spolenak@mat.ethz.ch.
Researchers explored micro-scale copper interconnects using advanced printing methods. They found that printing strategies significantly impact electrical properties, enabling control over resistivity for microelectronics.
Area of Science:
Background:
Purpose of the Study:
Main Methods:
Main Results:
Conclusions: