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0.2-4.0 THz broadband terahertz detector based on antenna-coupled AlGaN/GaN HEMTs arrayed in a bow-tie pattern
Optics Express
|May 9, 2023
Summary
This study presents a novel broadband terahertz detector using antenna-coupled AlGaN/GaN high-electron-mobility transistors (HEMTs), achieving continuous spectral response and high sensitivity for terahertz applications.
Area of Science:
- Terahertz (THz) technology
- Semiconductor device physics
- Optoelectronics
Background:
- The demand for broadband and high-sensitivity terahertz detectors is increasing.
- Existing detectors face limitations in performance and spectral coverage.
- Antenna-coupled high-electron-mobility transistors (HEMTs) offer a promising platform for THz detection.
Purpose of the Study:
- To design and verify a broadband terahertz detector with enhanced sensitivity and bandwidth.
- To investigate the performance of antenna-coupled AlGaN/GaN HEMTs across a wide frequency range.
- To characterize the detector's response and noise-equivalent power (NEP) at different temperatures.
Main Methods:
- Fabrication of a detector array with eighteen pairs of dipole antennas covering 0.24 to 7.4 THz.
- Integration of antennas with eighteen AlGaN/GaN HEMTs, sharing common source and drain terminals.
- Characterization of the detector's spectral response using incoherent terahertz radiation from a blackbody in a Fourier-transform spectrometer (FTS).
- Sensitivity measurements using coherent terahertz irradiation to determine noise-equivalent power (NEP).
Main Results:
- A continuous spectral response from 0.2 to 2.0 THz at 298 K and 0.2 to 4.0 THz at 77 K was observed.
- Average NEP of approximately 188 pW/Hz at 298 K and 19 pW/Hz at 77 K (0.2–1.1 THz).
- Maximum optical responsivity of 0.56 A/W and minimum NEP of 7.0 pW/Hz at 0.74 THz achieved at 77 K.
- NEP of 1.7 nW/Hz at 2.0 THz (298 K) and 3 nW/Hz at 4.0 THz (77 K) were measured.
Conclusions:
- The developed antenna-coupled AlGaN/GaN HEMT detector demonstrates broadband operation and high sensitivity.
- The detector performance is significantly enhanced at lower temperatures (77 K).
- Future improvements can be achieved by optimizing coupling components, reducing series resistance, and utilizing smaller gate lengths and higher-mobility materials.
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