Spatially Resolved Optical Spectroscopic Measurements with Simultaneous Photoelectrochemical Mapping Using Scanning...

A deep understanding of the properties of semiconductor films at the micro-/nanoscale level is fundamental toward designing effective photoelectrocatalysts. Here, we integrated spatially resolved optical spectroscopy (SR-OS) with scanning photoelectrochemical microscopy (SPECM) to collect UV/vis spectra and quantify photocurrents of localized sites on a nanostructured BiVO₄ thin film. Direct measurement of absorbance allowed for the determination of band gap energy at each location. Absorbance and photocurrent maps were obtained and used to investigate heterogeneities on the films. Scanning electrochemical cell microscopy (SECCM) was also coupled with SR-OS to acquire quantitative photoelectrochemical data at the FTO/BiVO₄ film interface, revealing higher photocurrents at the boundary regions. As a droplet-based technique, SECCM was employed to estimate the wetted area by measuring the maximum height of droplet stretch at each point, allowing for the calculation of photocurrent density. This novel approach provides an advantageous mean to correlate localized photocatalytic activities and band gap energies.