Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Concept Videos

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Highly conductive and ultrarobust elastic conductors for stretchable electronics.

Science advances·2026
Same author

Accelerated directional growth of seaweed-like iron oxide branches driven by localized electric fields of gold nanoparticles in liquid.

Nature communications·2026
Same author

Altered morphology and diffusivity of water confined in MXenes: Machine learning-accelerated computations combined with experiments.

Science advances·2026
Same author

Catalytic tango in diatomic catalysts: from precision-guided pair construction to machine-learning-driven identification and design.

Nanoscale·2026
Same author

Tailoring the phase transition pathway of Ag<sub>2</sub>Te nanowires <i>via</i> surface confinement: an <i>in situ</i> transmission electron microscopy study.

Nanoscale·2026
Same author

Revealing anisotropic lithiation control in silicon nanowires <i>via</i> a novel <i>in situ</i> TEM-based cross-sectional characterization method.

Nanoscale horizons·2025
Same journal

Fiber-optic triggering of a two-stage high-current linear transformer driver with laser energy below 100 μJ.

The Review of scientific instruments·2026
Same journal

Optimization of laboratory-scale x-ray absorption spectroscopy (XAS) apparatus for nuclear fuel research.

The Review of scientific instruments·2026
Same journal

Compressed multi-scale entropy and its application in mechanical fault diagnosis.

The Review of scientific instruments·2026
Same journal

Bidirectional drive and multi-resolution adjustment across frequency bands in inertial impact piezoelectric motors via multimodal resonant vibration.

The Review of scientific instruments·2026
Same journal

A magnetic field sensor based on flaky Terfenol-D material and dual fiber grating.

The Review of scientific instruments·2026
Same journal

A novel E-field eight-way cavity combiner for high-power S-band applications.

The Review of scientific instruments·2026
See all related articles

Related Experiment Video

Updated: Jul 30, 2025

Sample Drift Correction Following 4D Confocal Time-lapse Imaging
10:04

Sample Drift Correction Following 4D Confocal Time-lapse Imaging

Published on: April 12, 2014

16.5K

Application of optical flow algorithm for drift correction in electron microscopy images.

JiaHao Yao1, Hongxuan Guo1, Ziqing Yin1

  • 1SEU-FEI Nano-Pico Center, Key Laboratory of MEMS of Ministry of Education, School of Electronic Science and Engineering, Southeast University, Nanjing 210096, People's Republic of China.

The Review of Scientific Instruments
|May 15, 2023
PubMed
Summary
This summary is machine-generated.

This study introduces a new Transmission Electron Microscopy (TEM) image drift correction method using feature points and the Lucas-Kanade (LK) algorithm. It achieves high accuracy without increasing processing time, improving upon traditional cross-correlation methods.

More Related Videos

Picometer-Precision Atomic Position Tracking through Electron Microscopy
15:04

Picometer-Precision Atomic Position Tracking through Electron Microscopy

Published on: July 3, 2021

7.5K
Author Spotlight: A Machine-Vision Approach to Transmission Electron Microscopy Workflows, Results Analysis and Data Management
10:23

Author Spotlight: A Machine-Vision Approach to Transmission Electron Microscopy Workflows, Results Analysis and Data Management

Published on: June 23, 2023

2.9K

Related Experiment Videos

Last Updated: Jul 30, 2025

Sample Drift Correction Following 4D Confocal Time-lapse Imaging
10:04

Sample Drift Correction Following 4D Confocal Time-lapse Imaging

Published on: April 12, 2014

16.5K
Picometer-Precision Atomic Position Tracking through Electron Microscopy
15:04

Picometer-Precision Atomic Position Tracking through Electron Microscopy

Published on: July 3, 2021

7.5K
Author Spotlight: A Machine-Vision Approach to Transmission Electron Microscopy Workflows, Results Analysis and Data Management
10:23

Author Spotlight: A Machine-Vision Approach to Transmission Electron Microscopy Workflows, Results Analysis and Data Management

Published on: June 23, 2023

2.9K

Area of Science:

  • Materials Science
  • Microscopy Techniques
  • Image Processing

Background:

  • Transmission Electron Microscopy (TEM) is crucial for nanoscale imaging.
  • Image drift during TEM acquisition degrades resolution and accuracy.
  • Existing drift correction methods, like cross-correlation (CC), often lack precision or efficiency.

Purpose of the Study:

  • To develop a highly accurate and time-efficient TEM image drift correction strategy.
  • To overcome the limitations of pixel-by-pixel matching in conventional algorithms.
  • To enhance the applicability of TEM imaging through improved drift correction.

Main Methods:

  • Feature point extraction from initial TEM images.
  • Application of the Lucas-Kanade (LK) optical flow algorithm for feature point tracking.
  • Sub-pixel level correction using linear interpolation.
  • Integration of a semantic segmentation neural network for image pre-processing.

Main Results:

  • The proposed method significantly improves accuracy compared to the CC algorithm.
  • The strategy demonstrates robustness and is insensitive to image size.
  • Achieves high-precision drift correction without additional computational time.
  • Enhanced applicability through neural network-based pre-processing.

Conclusions:

  • The LK optical flow-based strategy offers a superior solution for TEM image drift correction.
  • This approach balances accuracy and speed, crucial for advanced microscopy.
  • The methodology is adaptable and can be further improved with pre-processing techniques.