Resolution improvement of photothermal microscopy by the modulated difference method
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Updated: Jul 29, 2025

Subsurface Defect Localization by Structured Heating Using Laser Projected Photothermal Thermography
Published on: May 15, 2017
Abstract:
Photothermal microscopy (PTM) was developed to image non-fluorescent objects. In the past two decades, PTM has reached single-particle and single-molecule sensitivity and has been used in the fields of material science and biology. However, PTM is a far-field imaging method whose resolution is restricted by the diffraction limits. This Letter reports a resolution improvement approach for photothermal microscopy called modulated difference PTM (MD-PTM), which utilizes Gaussian and doughnut formalism heating beams that are modulated at the same frequency but are of opposite phase to generate the photothermal signal. Furthermore, the opposite phase characteristics of the photothermal signals are applied to determine the objective profile from the PTM magnitude, and this helps to improve the lateral resolution of PTM. The lateral resolution is related to the difference coefficient between the Gaussian and doughnut heating beams; an increase in the difference coefficient causes a larger sidelobe of the MD-PTM amplitude, which readily forms an artifact. A pulse-coupled neural network (PCNN) is employed for phase image segmentations of MD-PTM. We experimentally study the micro-imaging of gold nanoclusters and crossed nanotubes using MD-PTM, and the results indicate that MD-PTM has merit in terms of improving the lateral resolution.
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