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Updated: Jul 29, 2025

Compact Lens-less Digital Holographic Microscope for MEMS Inspection and Characterization
Published on: July 5, 2016
Zhenghu Zhang1, Linwei Zhang2, Zhipeng Wu2
1School of Microelectronics, Shanghai University, Shanghai 201800, China.
This study introduces a high-sensitivity microelectromechanical system (MEMS) piezoelectric accelerometer using Scandium-doped Aluminum Nitride (ScAlN) thin film. The novel design achieves enhanced performance for detecting low-frequency vibrations.
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