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SRAM-Based PUF Readouts.

Sergio Vinagrero1, Honorio Martin2, Alice de Bignicourt3

  • 1Univ. Grenoble Alpes, CNRS, Grenoble INP, TIMA, 38000, Grenoble, France. sergio.vinagrero-gutierrez@univ-grenoble-alpes.fr.

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This summary is machine-generated.

This study introduces a new dataset for characterizing SRAM-based Physical Unclonable Functions (PUFs) on microcontrollers. The dataset aids in assessing PUF quality for hardware security applications.

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Area of Science:

  • Hardware Security
  • Embedded Systems Engineering
  • Integrated Circuit Design

Background:

  • Physical Unclonable Functions (PUFs) are crucial for hardware root of trust.
  • Large-scale characterization of PUFs is essential for industrial adoption but is time-consuming and costly.
  • Existing datasets for PUF characterization are limited, especially for microcontroller-based solutions.

Purpose of the Study:

  • To present a comprehensive dataset for SRAM-based PUFs on microcontrollers.
  • To facilitate the quality assessment and suitability evaluation of PUFs for hardware security.
  • To enable research into PUF aging and reliability properties.

Main Methods:

  • Collected SRAM readouts and internal sensor data (voltage, temperature) from 84 STM32 microcontrollers.
  • Developed a custom, open platform for automated data acquisition.
  • Designed the platform to support experiments on PUF aging and reliability.

Main Results:

  • A novel dataset comprising detailed SRAM readouts and environmental parameters for 84 microcontrollers.
  • The dataset enables large-scale parameter characterization of SRAM-based PUFs.
  • The data acquisition platform is validated for its efficiency and versatility.

Conclusions:

  • The presented dataset significantly reduces the effort required for PUF characterization.
  • This resource supports the development of robust hardware root of trust solutions.
  • The open platform fosters further research in PUF reliability and aging.