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Updated: Jul 28, 2025

Targeted Studies Using Serial Block Face and Focused Ion Beam Scan Electron Microscopy
Published on: August 10, 2019
Andrea G Marshall1, Kit Neikirk1, Dominique C Stephens1
1Department of Molecular Physiology and Biophysics, Vanderbilt University, Nashville, TN, 37232, USA.
Serial block face scanning electron microscopy (SBF-SEM) offers advanced 3D ultrastructural imaging for large volumes. This review covers SBF-SEM
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