Influence of bimetal interface confinement on the Hall-petch slope of multiscale Cu/Nb multilayer composites
Chaogang Ding1,2, Jie Xu1,2, Debin Shan1,2
1National Key Laboratory for Precision Hot Processing of Metals, Harbin Institute of Technology, Harbin, 150001, China.
Abstract:
Heterostructured materials afford a new way to improve the mechanical properties, which has become vital in both materials science and engineering applications. In the present research, Cu/Nb multilayer composites with layer thicknesses from the micrometer to nanometer were fabricated by accumulative roll bonding and the microstructure and mechanical properties of the Cu/Nb multilayer composites were then investigated. The yield strength and ultimate tensile strength of these composites increase with decreasing layer thickness. Moreover, the relationship between yield strength and (layer thickness)-1/2 approximately accords with the conventional Hall-Petch equation but with a decrease in the Hall-Petch slope when the layer thickness decreases from the micrometer to nanometer scales. The deformation microstructure of these Cu/Nb multilayer composites clearly exhibit dislocations glide in the layers, which reduces the stacking of dislocations at the Cu-Nb interface and thereby weakens the strengthening effect of the interface.
Related Concept Videos
Metal-Semiconductor Junctions
Schottky Barriers
Schottky barriers arise when a metal with a work function (Φm) contacts a semiconductor with a different work function (Φs). Initially, electrons transfer until the Fermi levels of the metal and semiconductor align at equilibrium. For instance, if Φm > Φs, the semiconductor Fermi level is higher than the metal's before contact. The...
Biasing of Metal-Semiconductor Junctions
In Schottky junctions, where the semiconductor is n-type, applying a positive voltage to the metal relative to the semiconductor reduces its Fermi...


