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Updated: Jul 28, 2025

Implementation of a Reference Interferometer for Nanodetection
Published on: April 26, 2014
Atsushi Ishizawa1,2, Tadashi Nishikawa3, Kenichi Hitachi4
1NTT Basic Research Laboratories, Nippon Telegraph and Telephone Corporation, 3-1 Morinosato Wakamiya, Atsugi, Kanagawa, 243-0198, Japan. ishizawa.atsushi@nihon-u.ac.jp.
Researchers developed a new method to directly measure absolute optical frequencies (AOFs) with high accuracy, eliminating the need for an optical reference. This breakthrough advances optical metrology and enhances wireless communication speeds.
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