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Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
Published on: December 5, 2015
Chuanrui Huo1, Kun Xu2,3, Liyang Ma4
1Beijing Advanced Innovation Center for Materials Genome Engineering, Department of Physical Chemistry, University of Science and Technology Beijing, Beijing 100083, China.
Researchers developed a novel strain engineering method to significantly boost ionic conductivity in nanocomposite films. This breakthrough offers a promising solution for low-temperature electrochemical and energy devices.
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