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Atomic Force Microscopy01:08

Atomic Force Microscopy

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Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
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Overview of Microscopy Techniques01:22

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The early pioneers of microscopy opened a window into the invisible world of microorganisms. In 1830, Joseph Jackson Lister created an essentially modern light microscope. The 20th century saw the development of microscopes that leveraged nonvisible light, such as fluorescence microscopy that uses an ultraviolet light source and electron microscopy that uses short-wavelength electron beams. These advances significantly improved magnification, image resolution, and contrast. By comparison, the...
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Related Experiment Video

Updated: Jul 25, 2025

Author Spotlight: Introduction to Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays
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Imaging beyond the surface region: Probing hidden materials via atomic force microscopy.

Amir Farokh Payam1, Ali Passian2

  • 1Nanotechnology and Integrated Bioengineering Centre, School of Engineering, Ulster University, Belfast, UK.

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High-resolution subsurface imaging is now possible using atomic force microscopy (AFM), overcoming previous nanometrology challenges for advanced materials and biological applications.

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Area of Science:

  • Nanometrology
  • Materials Science
  • Surface Science

Background:

  • Surface imaging at the atomic scale is achievable.
  • High-resolution subsurface imaging faces challenges from electromagnetic and acoustic dispersion and diffraction.
  • Scanning probe microscopy (SPM) with an atomically sharp probe has enabled surface limit breakthroughs.

Purpose of the Study:

  • To explore the physics behind subsurface imaging challenges.
  • To present emerging solutions for high-resolution subsurface visualization.
  • To discuss diverse applications of these advanced imaging techniques.

Main Methods:

  • Utilizing atomic force microscopy (AFM), a type of SPM.
  • Leveraging physical, chemical, electrical, and thermal gradients within materials.
  • Exploring label-free, nondestructive measurement capabilities.

Main Results:

  • Demonstrated potential for visualizing subsurface material properties.
  • Identified conditions enabling subsurface imaging.
  • Highlighted the versatility of AFM for subsurface analysis.

Conclusions:

  • Subsurface imaging using AFM offers exceptional potential for visualization.
  • Techniques are applicable across materials science, electronics, biology, and polymer sciences.
  • Future work can enable noninvasive investigation of meta- and quantum materials.