Metal-Semiconductor Junctions
Biasing of Metal-Semiconductor Junctions
You might also read
Articles linked to this work by shared authors, journal, and citation graph.
Updated: Jul 25, 2025

A High Performance Impedance-based Platform for Evaporation Rate Detection
Published on: October 17, 2016
Youdi Liu1, Faheem Ershad2, Yifan Tao1
1Department of Engineering Science and Mechanics, Pennsylvania State University, University Park, PA, USA.
No abstract available in PubMed .