Overview of Microscopy Techniques
Atomic Force Microscopy
You might also read
Articles linked to this work by shared authors, journal, and citation graph.
Updated: Jul 25, 2025

Author Spotlight: Introduction to Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays
Published on: June 13, 2023
We developed a sub-terahertz scattering-type scanning near-field microscope (sub-THz s-SNOM) using a metallic tip and quartz tuning fork. This novel probe enables high-resolution terahertz imaging and operates flexibly across cryogenic environments.
Area of Science:
Background:
Purpose of the Study:
Main Methods:
Main Results:
Conclusions: