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Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
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Edge contacts accelerate the response of MoS2 photodetectors

Fabian Strauß1,2, Christine Schedel1, Marcus Scheele1,2

  • 1Institute of Physical and Theoretical Chemistry, University of Tübingen Auf der Morgenstelle 18 72076 Tübingen Germany marcus.scheele@uni-tuebingen.de.

Nanoscale Advances
|June 29, 2023
PubMed

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