Molecular and Ionic Solids
Lattice Centering and Coordination Number
Electrostatic Boundary Conditions in Dielectrics
Metal-Semiconductor Junctions
Ionic Bonding and Electron Transfer
Types of Semiconductors
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Updated: Jul 25, 2025

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
Published on: May 28, 2016
Roger De Souza1, George Harrington2,3
1Institute of Physical Chemistry, RWTH Aachen University, Aachen, Germany. desouza@pc.rwth-aachen.de.
No abstract available in PubMed .