Automatic Piecewise Extreme Learning Machine-Based Model for S-Parameters of RF Power Amplifier

Lulu Wang1,2, Shaohua Zhou3,4,5, Wenrao Fang2

  • 1School of Micro-Nano Electronics, Zhejiang University, Hangzhou 310058, China.

Micromachines
|July 8, 2023
PubMed
Summary

This study introduces an automatic piecewise extreme learning machine (ELM) for radio-frequency power amplifier S-parameters modeling. The novel method significantly improves modeling speed and accuracy compared to existing techniques.

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