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Automatic Piecewise Extreme Learning Machine-Based Model for S-Parameters of RF Power Amplifier
Lulu Wang1,2, Shaohua Zhou3,4,5, Wenrao Fang2
1School of Micro-Nano Electronics, Zhejiang University, Hangzhou 310058, China.
Micromachines
|July 8, 2023
Summary
This study introduces an automatic piecewise extreme learning machine (ELM) for radio-frequency power amplifier S-parameters modeling. The novel method significantly improves modeling speed and accuracy compared to existing techniques.
Area of Science:
- Electrical Engineering
- Computational Intelligence
Background:
- Accurate modeling of radio-frequency (RF) power amplifiers (PAs) is crucial for modern communication systems.
- Existing modeling techniques like Long-Short Term Memory (LSTM), Support Vector Regression (SVR), and conventional Extreme Learning Machine (ELM) face challenges in speed and accuracy.
Purpose of the Study:
- To develop an efficient and accurate automatic piecewise (Auto-PW) extreme learning machine (ELM) method for S-parameters modeling of RF PAs.
- To enhance the modeling speed and accuracy of RF PA S-parameters.
Main Methods:
- Proposed an automatic piecewise (Auto-PW) extreme learning machine (ELM) approach.
- Implemented a region-splitting strategy based on concave-convex characteristic changing points.
- Developed piecewise ELM models for distinct regions.
Main Results:
- The Auto-PW ELM method demonstrated superior performance on S-parameters measured from a 2.2-6.5 GHz CMOS PA.
- Achieved modeling speeds two orders of magnitude faster than SVR and LSTM.
- Obtained modeling accuracy more than one order of magnitude higher than conventional ELM.
Conclusions:
- The Auto-PW ELM method offers a significant advancement in RF PA S-parameters modeling.
- This approach provides a faster and more accurate alternative to existing modeling techniques.
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