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Passivation effect on Cd0.95Mn0.05Te0.98Se0.02 radiation detection performance.

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Summary

Sodium hypochlorite (NaOCl) passivation effectively addresses Te-rich surface layers in cadmium telluride (CdTe) detectors. This method enhances charge carrier transport and reduces leakage current, improving detector performance.

Keywords:
CdMnTeSeCharge collection efficiencyPassivationSodium hypochloriteSurface recombination velocity

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Area of Science:

  • Materials Science
  • Semiconductor Physics
  • Detector Technology

Background:

  • Bromine etching in cadmium telluride (CdTe) detector fabrication creates Te-rich surface layers.
  • These Te-rich layers act as charge carrier traps, degrading transport properties and increasing leakage current.
  • This negatively impacts the overall performance and reliability of CdTe-based detectors.

Purpose of the Study:

  • To investigate the efficacy of sodium hypochlorite (NaOCl) as a passivating agent for CdTe-based detectors.
  • To analyze the impact of NaOCl passivation on the surface chemistry and performance of Cd0.95Mn0.05Te0.98Se0.02 (CMTS) detectors.
  • To demonstrate the potential of NaOCl in mitigating fabrication-induced surface defects.

Main Methods:

  • Passivation of CMTS samples using sodium hypochlorite (NaOCl) solution.
  • Surface chemical analysis using X-ray photoelectron spectroscopy (XPS) to determine surface composition and chemical states.
  • Performance evaluation of passivated CMTS detectors using an Am-241 radioisotope source.

Main Results:

  • XPS analysis confirmed the formation of tellurium oxide and the removal of water from the CMTS surface after NaOCl passivation.
  • Passivated CMTS detectors exhibited significantly reduced leakage current compared to unpassivated samples.
  • Enhanced detector performance was observed, indicated by improved charge carrier transport and reduced charge loss.

Conclusions:

  • Sodium hypochlorite (NaOCl) passivation is an effective method to treat Te-rich surface layers in CMTS detectors.
  • NaOCl passivation successfully reduces leakage current and compensates for surface defects.
  • The improved charge carrier transport and reduced charge loss lead to enhanced performance of CMTS detectors.