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Updated: Jul 23, 2025

Functionalization of Atomic Force Microscope Cantilevers with Single-T Cells or Single-Particle for Immunological Single-Cell Force Spectroscopy
Published on: July 10, 2019
Junxi Wang1, Mingyan Gao1, Lixin Yang2
1International Research Centre for Nano Handling and Manufacturing of China, Changchun University of Science and Technology, Changchun 130022, China; Ministry of Education Key Laboratory for Cross-Scale Micro and Nano Manufacturing, Changchun University of Science and Technology, Changchun 130022, China; Zhongshan Institute of Changchun University of Science and Technology, Zhongshan, China.
This study introduces a novel deep learning approach using atomic force microscopy (AFM) for accurate cell type recognition. The method effectively analyzes physical properties, enabling universal automated cell information analysis.
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