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Quantitative electric field mapping between electrically biased needles by scanning transmission electron microscopy

Jean Felix Dushimineza1, Janghyun Jo2, Rafal E Dunin-Borkowski2

  • 1Department of Chemistry and Centre for NanoScience, Ludwig-Maximilians-Universität München, Butenandtstrasse 11, 81377 Munich, Germany; Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons (ER-C), Forschungszentrum Jülich, 52425 Jülich, Germany.

Ultramicroscopy
|July 15, 2023
PubMed

Keywords:
4D-STEMElectric field mappingFinite-element analysisFirst-moment STEMMultisliceOff-axis electron holographyPerturbed reference wave effect

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