Correlating Optical Microspectroscopy with 4×4 Transfer Matrix Modeling for Characterizing Birefringent Van der Waals

Julian Schwarz1, Michael Niebauer1, Maria Koleśnik-Gray2

  • 1Friedrich-Alexander-Universität Erlangen-Nürnberg (FAU), Electron Devices, Cauerstraße 6, 91058, Erlangen, Germany.

Small Methods
|July 18, 2023
PubMed
Summary

Accurately measuring the thickness of Van der Waals materials is crucial for their electronic applications. This study introduces a new optical reflectance method for precise, nondestructive thickness determination, even for encapsulated layers.

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