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Nonlinear confocal positioner for micron-scale target alignment.

J Delgado-Aguillón, C Ruiz, M Rosete-Aguilar

|July 21, 2023

Summary

This summary is machine-generated.

This study introduces a novel target positioner system with micron-scale precision. Its nonlinear detection scheme enhances sensitivity for applications in laser microfabrication and plasma accelerators.

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Area of Science:

Optics and Photonics
Precision Engineering
Laser Technology

Background:

Accurate target positioning is crucial for advanced scientific applications.
Existing systems often face limitations in sensitivity, accuracy, or alignment complexity.

Purpose of the Study:

To present a novel target positioner system with high sensitivity and accuracy.
To demonstrate a system feasible for microfabrication and laser-driven plasma accelerators.

Main Methods:

Utilized a nonlinear detection scheme with two-photon-absorption in a Si-photodiode and CMOS sensor at 1550 nm.
Employed a confocal configuration for ease of alignment and tilt tolerance, eliminating the need for a pinhole aperture.

Main Results:

Achieved micron-scale precision in locating rough target surfaces within the focal plane.
Demonstrated high accuracy up to 5 μm, limited by focus scanning step size.
System exhibits high sensitivity due to the nonlinear detection process.

Conclusions:

The novel target positioner system offers significant advancements in precision and sensitivity.
Potential applications include laser microfabrication and high-repetition-rate laser-driven plasma accelerators.
The system's design is adaptable for cameras and other spectral ranges.