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Atomic Mass01:52

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Atoms — and the protons, neutrons, and electrons that compose them — are extremely small. For example, a carbon atom weighs less than 2 × 10−23 g. When describing the properties of tiny objects such as atoms, we use appropriately small units of measure, such as the atomic mass unit (amu). The amu was originally defined based on hydrogen, the lightest element, then later in terms of oxygen. Since 1961, it has been defined with regard to the most abundant isotope of...
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For AAS measurements, samples must be introduced as clear solutions, often requiring extensive preliminary treatment to dissolve materials like soils, animal tissues, and minerals. Common methods for sample preparation include treatment with hot mineral acids, wet ashing, combustion in closed containers, high-temperature ashing, or fusion with reagents.
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Interference leads to systematic error in atomic absorption (AA) measurements by enhancing or diminishing the analytical signal or the background. These interferences can be grouped into three main categories: spectral interference, chemical interference, and physical interference.
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In atomic emission spectroscopy (AES), high-temperature atomizers excite a broad range of elements and molecules that generate complex emissions from sources such as oxides, hydroxides, and flame combustion products in the flame or plasma. Several strategies can be employed to minimize spectral interferences caused by overlapping emission lines or bands. These include increasing instrument resolution, choosing alternative emission lines, optimally placing the detector in low-background regions,...
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Atomic Emission Spectroscopy: Lab01:29

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AES is a powerful analytical technique, especially effective when used with plasma sources, producing abundant spectra in characteristic emission lines. The Inductively Coupled Plasma (ICP), in particular, yields superior quantitative analytical data due to its high stability, low noise, low background, and minimal interferences under optimal experimental conditions. However, newer air-operated microwave sources are emerging as promising alternatives that could be more cost-effective than...
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In Situ Detection and Single Cell Quantification of Metal Oxide Nanoparticles Using Nuclear Microprobe Analysis
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An Improved Average Atomic Number Calculation for Estimating Backscatter and Continuum Production in Compounds.

John Donovan1, Andrew Ducharme2, Joseph J Schwab2

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Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
|July 25, 2023
PubMed
Summary

Accurate X-ray microanalysis in compounds requires a new approach beyond average atomic number (Z-bar) assumptions. This study introduces a Z-fraction method, improving electron backscatter and bremsstrahlung predictions in materials science.

Keywords:
EPMAaverage atomic numberbackscattercompoundscontinuumz-bar

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Area of Science:

  • Materials Science
  • Physics
  • Analytical Chemistry

Background:

  • Electron backscatter and bremsstrahlung in X-ray microanalysis are often predicted using average atomic number (Z-bar) assumptions.
  • This Z-bar extrapolation from pure elements to compounds is known to be inaccurate.
  • Current methods using simple atomic or mass fractions have significant limitations.

Purpose of the Study:

  • To develop a more accurate method for predicting electron backscatter and continuum production in compounds during X-ray microanalysis.
  • To address the inaccuracies of existing average atomic number (Z-bar) extrapolation methods.
  • To propose a new model that accounts for the variations in nuclear screening within compounds.

Main Methods:

  • Developed a novel expression for calculating electron interactions in compounds.
  • Utilized atomic fractions of atomic numbers (Z-fraction) instead of mass fractions.
  • Incorporated an exponent to model the variation in nuclear screening as a function of atomic number (Z).

Main Results:

  • The proposed Z-fraction method provides a more physically sound basis for extrapolating electron interaction phenomena in compounds.
  • Demonstrated that mass-based averaging introduces errors, particularly as neutron mass is negligible below 1 MeV.
  • The new model offers improved accuracy for predicting electron backscatter and bremsstrahlung compared to traditional Z-bar methods.

Conclusions:

  • The Z-fraction approach offers a significant improvement over existing methods for X-ray microanalysis in compounds.
  • Accurate modeling of electron-solid interactions in complex materials necessitates considering atomic number variations and nuclear screening effects.
  • This work provides a refined tool for quantitative analysis in materials science and related fields.