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Atomic Force Microscopy

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

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Updated: Jul 21, 2025

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis

Published on: May 10, 2021

Atomically Resolved Defects on Thin Molybdenum Carbide (α-Mo₂C) Crystals.

Saima A Sumaiya¹, Ilker Demiroglu², Omer R Caylan³

¹Department of Mechanical Engineering, University of California Merced, Merced, California 95343, United States.

Langmuir : the ACS Journal of Surfaces and Colloids

|July 26, 2023

Summary

Defects in thin molybdenum carbide (α-Mo₂C) crystals were studied using conductive atomic force microscopy and density functional theory. This research clarifies how defects influence the material's conductivity, crucial for understanding its properties.

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Last Updated: Jul 21, 2025

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis

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Area of Science:

Materials Science
Solid State Physics
Surface Science

Background:

Thin transition metal carbides (TMCs) show promise due to excellent mechanical, electrical, and stability properties.
Understanding defect impacts on TMCs is vital for their application potential.
Molybdenum carbide (α-Mo₂C) is a representative TMC with limited defect characterization.

Purpose of the Study:

To investigate the atomic-scale nature of defects in thin molybdenum carbide (α-Mo₂C) crystals.
To correlate defect types with their effects on electrical conductivity.
To elucidate the role of defects in the physical properties of α-Mo₂C.

Main Methods:

Growth of thin α-Mo₂C crystals using chemical vapor deposition (CVD).
Atomic-resolution characterization via conductive atomic force microscopy (C-AFM) under ambient conditions.
Computational analysis using *ab initio* density functional theory (DFT) calculations.

Main Results:

Defects were identified and classified by their impact on conductivity (enhancement/attenuation) and spatial distribution (compact/extended).
C-AFM revealed variations in conductivity landscape attributed to specific defect types.
DFT calculations provided insights into the atomic structure and electronic nature of observed defects.

Conclusions:

Defect characterization in α-Mo₂C is essential for understanding its electronic properties.
The combined C-AFM and DFT approach effectively probes defect-property relationships in TMCs.
This study provides a foundation for defect engineering in molybdenum carbide for tailored applications.