Electron Microscope Tomography and Single-particle Reconstruction
Three-Dimensional Microscopy in Microbiology
Scanning Electron Microscopy
Atomic Force Microscopy
X-ray Diffraction of Biological Samples
You might also read
Articles linked to this work by shared authors, journal, and citation graph.
Updated: Jul 20, 2025

Using Synchrotron Radiation Microtomography to Investigate Multi-scale Three-dimensional Microelectronic Packages
Published on: April 13, 2016
Akio Yoneyama1,2, Kotaro Ishiji3, Atsushi Sakaki4
1Research and Development Group, Hitachi Ltd., 1-280 Higashi-Koigakubo, Kokubunji, 185-8601, Japan. yoneyama@saga-ls.jp.
A new 3D X-ray topography technique (3D μ-XRT) allows non-destructive, high-resolution imaging of internal crystal defects. This method visualizes dislocations in materials like SiC with micrometer accuracy, advancing material analysis.
Area of Science:
Background:
Purpose of the Study:
Main Methods:
Main Results:
Conclusions: