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High-resolution and high-sensitivity X-ray ptychographic coherent diffraction imaging using the CITIUS detector.

Yukio Takahashi1, Masaki Abe2, Hideshi Uematsu2

  • 1Institute of Multidisciplinary Research for Advanced Materials (IMRAM), Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai 980-8577, Japan.

Journal of Synchrotron Radiation
|August 1, 2023
PubMed
Summary

This study demonstrates the CITIUS high-speed X-ray detector for ptychographic coherent diffraction imaging (PCDI). The detector achieves high resolution and phase sensitivity, advancing synchrotron X-ray microscopy.

Keywords:
CITIUSpychographic coherent diffraction imaging

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Area of Science:

  • Synchrotron X-ray microscopy
  • Coherent diffraction imaging
  • Advanced detector technology

Background:

  • Ptychographic coherent diffraction imaging (PCDI) requires high-performance synchrotron sources and detectors for optimal spatial resolution and field of view.
  • Improving detector capabilities is crucial for enhancing PCDI performance.

Purpose of the Study:

  • To report ptychographic diffraction pattern measurements using the CITIUS high-speed X-ray image detector.
  • To evaluate the performance of the CITIUS detector in PCDI applications.
  • To demonstrate image reconstruction from CITIUS detector data.

Main Methods:

  • Utilized synchrotron X-rays at 6.5 keV, focused by total reflection mirrors to achieve a flux of ~2.6 × 10^10 photons/s.
  • Employed the CITIUS high-speed X-ray image detector for diffraction intensity data collection, reaching up to ~250 Mcounts/s/pixel without saturation.
  • Performed ptychographic measurements on tantalum test charts and silica particles, followed by phase image reconstruction.

Main Results:

  • Achieved a spatial resolution of approximately 10 nm.
  • Obtained a phase sensitivity of approximately 0.01 radians.
  • Demonstrated successful image reconstruction with high fidelity.

Conclusions:

  • The CITIUS detector is suitable for PCDI observations with various samples using low-emittance synchrotron sources.
  • The detector's capabilities support the stability evaluation of X-ray light sources.
  • This work advances high-resolution X-ray imaging techniques.