Related Experiment Video
Updated: Jul 20, 2025

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
Published on: May 10, 2021
Direct imaging of local atomic structures in zeolite using optimum bright-field scanning transmission electron
Kousuke Ooe1,2, Takehito Seki1,3, Kaname Yoshida2
1Institute of Engineering Innovation, School of Engineering, the University of Tokyo, Yayoi 2-11-16, Bunkyo, Tokyo 113-0032, Japan.
Abstract:
Zeolites are used in industries as catalysts, ion exchangers, and molecular sieves because of their unique porous atomic structures. However, direct observation of zeolitic local atomic structures via electron microscopy is difficult owing to low electron irradiation resistance. Subsequently, their fundamental structure-property relationships remain unclear. A low-electron-dose imaging technique, optimum bright-field scanning transmission electron microscopy (OBF STEM), has recently been developed. It reconstructs images with a high signal-to-noise ratio and a dose efficiency approximately two orders of magnitude higher than that of conventional methods. Here, we performed low-dose atomic-resolution OBF STEM observations of two types of zeolite, effectively visualizing all atomic sites in their frameworks. In addition, we visualized the complex local atomic structure of the twin boundaries in a faujasite (FAU)-type zeolite and Na+ ions with low occupancy in eight-membered rings in a Na-Linde Type A (LTA) zeolite. The results of this study facilitate the characterization of local atomic structures in many electron beam-sensitive materials.
Related Concept Videos
Electron Microscope Tomography and Single-particle Reconstruction
Electron Tomography
Electron tomography can be performed either in TEM or STEM (scanning transmission...
Scanning Electron Microscopy
Fundamental Principles
Accelerated...
Transmission Electron Microscopy
Overview of Electron Microscopy
Overview of Microscopy Techniques

