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Back illuminated photo emission electron microscopy (BIPEEM).
Amin Moradi1, Matthijs Rog1, Guido Stam1
1Leiden Institute of Physics, Niels Bohrweg2, Leiden, the Netherlands.
Ultramicroscopy
|August 6, 2023
Summary
A new technique, back-illuminated Photo Emission Electron Microscopy (BIPEEM), images sample thickness and inner structure. This method complements traditional PEEM by illuminating samples from behind.
Area of Science:
- Surface Science
- Microscopy Techniques
- Materials Characterization
Background:
- Photo Emission Electron Microscopy (PEEM) is a surface-sensitive technique.
- Existing PEEM methods primarily probe sample surfaces.
Purpose of the Study:
- To introduce and describe a novel PEEM variant: back-illuminated PEEM (BIPEEM).
- To demonstrate BIPEEM's capability to image both surface and inner sample information.
Main Methods:
- Developing a back-illuminated PEEM (BIPEEM) setup.
- Placing samples on transparent substrates for back-side illumination.
- Collecting emitted electrons from the front side.
Main Results:
- BIPEEM images exhibit strong thickness dependence.
- A model correlating electron intensity with optical attenuation length and electron mean free path was established.
- Experimental demonstration of BIPEEM's ability to capture inner and surface information.
Conclusions:
- BIPEEM offers complementary insights to conventional PEEM.
- The technique provides a method for depth-resolved imaging in PEEM.
- BIPEEM expands the applicability of electron microscopy for materials analysis.
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