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The wavelengths of visible light ultimately limit the maximum theoretical resolution of images created by light microscopes. Most light microscopes can only magnify 1000X, and a few can magnify up to 1500X. Electrons, like electromagnetic radiation, can behave like waves, but with wavelengths of 0.005 nm, they produce significantly greater resolution up to 0.05 nm as compared to 500 nm for visible light. An electron microscope (EM) can create a sharp image that is magnified up to 2,000,000X.
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In 1931, physicist Ernst Ruska—building on the idea that magnetic fields can direct an electron beam just as lenses can direct a beam of light in an optical microscope—developed the first prototype of the electron microscope. This development led to the development of the field of electron microscopy. In the transmission electron microscope (TEM), electrons are produced by a hot tungsten element and accelerated by a potential difference in an electron gun, which gives them up to 400...
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Back illuminated photo emission electron microscopy (BIPEEM).

Amin Moradi1, Matthijs Rog1, Guido Stam1

  • 1Leiden Institute of Physics, Niels Bohrweg2, Leiden, the Netherlands.

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|August 6, 2023
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Summary

A new technique, back-illuminated Photo Emission Electron Microscopy (BIPEEM), images sample thickness and inner structure. This method complements traditional PEEM by illuminating samples from behind.

Keywords:
Back illuminated PEEM (BIPEEM)Electron mean free pathLow energy electron microscopy (LEEM)Photo emission electron microscopy (PEEM)PhotocathodePhoton penetration depth

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Area of Science:

  • Surface Science
  • Microscopy Techniques
  • Materials Characterization

Background:

  • Photo Emission Electron Microscopy (PEEM) is a surface-sensitive technique.
  • Existing PEEM methods primarily probe sample surfaces.

Purpose of the Study:

  • To introduce and describe a novel PEEM variant: back-illuminated PEEM (BIPEEM).
  • To demonstrate BIPEEM's capability to image both surface and inner sample information.

Main Methods:

  • Developing a back-illuminated PEEM (BIPEEM) setup.
  • Placing samples on transparent substrates for back-side illumination.
  • Collecting emitted electrons from the front side.

Main Results:

  • BIPEEM images exhibit strong thickness dependence.
  • A model correlating electron intensity with optical attenuation length and electron mean free path was established.
  • Experimental demonstration of BIPEEM's ability to capture inner and surface information.

Conclusions:

  • BIPEEM offers complementary insights to conventional PEEM.
  • The technique provides a method for depth-resolved imaging in PEEM.
  • BIPEEM expands the applicability of electron microscopy for materials analysis.