Defining optimal thickness for maximal self-fieldJcin YBCO/CeO2multilayers grown on buffered metal.
Summary
Multilayering Yttrium Barium Copper Oxide (YBCO) thin films with Cerium Dioxide (CeO2) enhances critical current density, especially at higher temperatures. Optimal YBCO layer thickness is crucial for maximizing performance in coated conductor technology.
Area of Science:
- Materials Science
- Condensed Matter Physics
- Thin Film Technology
Background:
- High-performance superconducting materials are essential for advanced technologies.
- Yttrium Barium Copper Oxide (YBCO) is a key material for superconducting applications.
- Optimizing critical current density (Jc) is vital for the practical use of YBCO films.
Purpose of the Study:
- To investigate the effect of multilayering YBCO thin films with CeO2 interlayers.
- To optimize the self-field critical current density (Jc(0)) in YBCO films.
- To understand the relationship between film thickness, temperature, and Jc(0).
Main Methods:
- Fabrication of multilayered YBCO thin films with sequentially deposited CeO2 layers.
- Growth of films on buffered metallic templates.
- Experimental measurement and theoretical analysis of film growth mechanisms.
Main Results:
- Significant improvement in Jc(0) observed in multilayered films compared to single-layer YBCO.
- Jc(0) enhancement is dependent on YBCO layer thickness and operating temperature.
- Up to a 50% increase in Jc(0) achieved at high temperatures.
- A critical YBCO layer thickness was identified for maximal Jc(0), linked to strain relaxation and defect formation.
Conclusions:
- Multilayering YBCO with CeO2 is an effective strategy for enhancing critical current density.
- Understanding strain relaxation and defect dynamics is key to optimizing film performance.
- Results are directly applicable to advancing coated conductor technology for improved in-field Jc(B).
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