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Venous thoracic outlet syndrome, as a pitfall for cardiac implantable electronic device implantations
Daisuke Kawano1,2, Hitoshi Mori1, Masanori Taniwaki2
1Department of Cardiology, Saitama Medical University, International Medical Center, Hidaka-shi, Saitama, Japan.
Abstract:
The subclavian vein is typically used in cardiovascular implantable electronic device (CIED) implantations. External stress on the subclavian vein can lead to lead-related complications. There are several causes of this stress, such as frequent upper extremity movements or external injury. Venous thoracic outlet syndrome (TOS) can also become the cause of external lead stress. However, the diagnosis of venous TOS can be challenging because subclavian venography can appear normal at first glance. We present a unique case of a device infection in a patient with venous TOS. A careful observation of the imaging studies is vital for diagnosing venous TOS and a leadless pacemaker implantation could be an alternative therapeutic option.
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