Effect of metal implants and metal artifacts on back-projected two-dimensional entrance fluence determined by EPID
Zheng Cao1,2, Xiang Gao2, Gongfa Liu1
1National Synchrotron Radiation Laboratory, University of Science and Technology of China, Hefei, China.
Purpose:
To evaluate the errors caused by metal implants and metal artifacts in the two-dimensional entrance fluences reconstructed using the back-projection algorithm based on electronic portal imaging device (EPID) images.
Methods:
The EPID in the Varian VitalBeam accelerator was used to acquire portal dose images (PDIs), and then commercial EPID dosimetry software was employed to reconstruct the two-dimensional entrance fluences based on computed tomography (CT) images of the head phantoms containing interchangeable metal-free/titanium/aluminum round bars. The metal-induced errors in the two-dimensional entrance fluences were evaluated by comparing the γ results and the pixel value errors in the metal-affected regions. We obtained metal-artifact-free CT images by replacing the voxel values of non-metal inserts with those of metal inserts in metal-free CT images to evaluate the metal-artifact-induced errors.
Results:
The γ passing rates (versus PDIs obtained without a phantom in the beam field (PDIair ), 2%/2 mm) for the back-projected two-dimensional entrance fluences of phantoms containing titanium or aluminum (BPTi /BPAl ) were reduced from 92.4% to 90.5% and 90.6%, respectively, relative to the metal-free phantom (BPmetal-free ). Titanium causes more severe metal artifacts in CT images than aluminum, and its removal resulted in a 0.0022 CU (median) reduction in the pixel value of BPTi artifact-free relative to BPTi in the metal-affected region. Moreover, the mean absolute error (MAE) and root mean square error (RMSE) decreased from 0.0050 CU and 0.0063 CU to 0.0034 CU and 0.0040 CU, respectively (vs. BPmetal-free ).
Conclusion:
Metal implants increase the errors in back-projected two-dimensional entrance fluences, and metals with higher electron densities cause more errors. For high-electron-density metal implants that produce severe metal artifacts (e.g., titanium), removing metal artifacts from the CT images can improve the accuracy of the two-dimensional entrance fluences reconstructed by back-projection algorithms.
