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Published on: October 11, 2018
Sparse solution of least-squares twin multi-class support vector machine using ℓ0 and ℓp-norm for classification and
Hossein Moosaei1, Milan Hladík2
1Department of Informatics, Faculty of Science, Jan Evangelista Purkyně University, Ústí nad Labem, Czech Republic; Department of Econometrics, Prague University of Economics and Business, Czech Republic.
This study introduces the ℓp-norm least-squares twin multi-class support vector machine (PLSTKSVC) for improved multi-class classification and feature selection. The novel method enhances classification accuracy and reduces features in high-dimensional datasets.
Area of Science:
- Machine Learning
- Computer Science
Background:
- Multi-class classification challenges exist, particularly with high-dimensional data.
- Existing methods like Twin K-class Support Vector Classification (Twin-KSVC) and its improvements (ILSTKSVC) influence classification accuracy but often neglect feature selection.
Purpose of the Study:
- To propose a novel method, ℓp-norm least-squares twin multi-class support vector machine (PLSTKSVC), that simultaneously performs classification and feature selection.
- To address the limitations of prior studies by integrating feature selection into the multi-class classification framework.
Main Methods:
- Developed PLSTKSVC, inspired by ILSTKSVC and cardinality-constrained optimization, using 0
- The optimization problems are solved efficiently by solving systems of linear equations for an approximate solution.
- Investigated the properties of optimum solutions under specific assumptions.
Main Results:
- The proposed PLSTKSVC method demonstrated superior performance across several real-world datasets.
- Achieved higher classification accuracy compared to existing strategies.
- Successfully reduced the number of features, indicating effective feature selection.
Conclusions:
- PLSTKSVC offers a robust and efficient approach for simultaneous multi-class classification and feature selection.
- The method shows significant potential for applications involving high-dimensional datasets where both accuracy and dimensionality reduction are crucial.
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