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Mechanoluminescent Visualization of Crack Propagation for Joint Evaluation
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Crackling noise microscopy.

Cam-Phu Thi Nguyen1, Peggy Schoenherr1,2, Ekhard K H Salje3

  • 1School of Materials Science and Engineering, UNSW Sydney, Sydney, NSW, 2052, Australia.

Nature Communications
|August 16, 2023
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Summary
This summary is machine-generated.

Crackling noise, a universal phenomenon in materials, can now be measured at the nanoscale using crackling noise microscopy. This new technique reveals altered avalanche behavior at ferroelectric domain walls.

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Area of Science:

  • Materials Science
  • Condensed Matter Physics
  • Nonlinear Dynamics

Background:

  • Crackling noise is a scale-invariant phenomenon in driven nonlinear systems, characterized by avalanche-like events following power-law distributions.
  • This phenomenon, initially observed as Barkhausen noise in magnetic materials, is relevant across diverse fields including geophysics, materials engineering, and statistical physics.
  • Understanding crackling noise is crucial for characterizing the dynamics of complex material systems under external stimuli.

Purpose of the Study:

  • To develop and demonstrate a novel method for nanoscale crackling noise measurements.
  • To investigate the crackling dynamics of individual nanoscale features, specifically ferroelectric domain walls.
  • To explore how nanoscale features influence the universal scaling laws of crackling noise.

Main Methods:

  • Utilizing Atomic Force Microscopy (AFM) nanoindentation for precise force application and displacement measurement.
  • Developing a technique termed "crackling noise microscopy" to probe individual nanoscale features.
  • Analyzing the size and distribution of avalanches generated during nanoindentation.

Main Results:

  • Successfully measured nanoscale crackling noise from individual ferroelectric domain walls using AFM nanoindentation.
  • Observed altered critical exponents for avalanches at nanoscale topological defects compared to bulk domains.
  • Demonstrated a suppression of mixed-criticality at these nanoscale features, deviating from bulk behavior.

Conclusions:

  • Crackling noise microscopy provides a powerful new tool for studying nanoscale phenomena in materials.
  • Ferroelectric domain walls exhibit distinct crackling dynamics, influencing critical exponents and mixed-criticality.
  • The presented method has broad applicability for investigating crackling noise in various individual nanoscale material systems.