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Effect of analysis software program on measured deviations in complete arch, implant-supported framework scans.

Doğu Ömür Dede¹, Gülce Çakmak², Mustafa Borga Donmez³

¹Department of Prosthodontics, Ordu University, Ordu, Turkey.

The Journal of Prosthetic Dentistry

|August 18, 2023

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The nonmetrology-grade freeware program demonstrated comparable overall deviation measurements to metrology-grade software for complete arch, implant-supported frameworks. However, it showed inferiority in marginal deviation analysis for PEEK frameworks scanned with the E4 laboratory scanner.

Area of Science:

Dental Technology
Digital Dentistry
Biomaterials Science

Background:

Fabrication trueness analysis is crucial for clinicians and dental laboratory technicians.
Nonmetrology-grade freeware programs offer potential for routine practice, but their performance against metrology-grade software is not well-established.
Limited knowledge exists on the comparative accuracy of freeware for analyzing complete arch, implant-supported framework deviations.

Purpose of the Study:

To evaluate the impact of analysis software on measured deviations in complete arch, implant-supported framework scans.
To compare the performance of a nonmetrology-grade freeware program against a metrology-grade software for fabrication trueness analysis.

Main Methods:

Twenty complete arch, implant-supported frameworks (10 PEEK, 10 Titanium) were fabricated from a master STL file.

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Frameworks were digitized using various scanners to create test STL files.

Overall and marginal deviations were measured using root mean square (RMS) method in both freeware (Medit Link) and metrology-grade (Geomagic Control X) software.

Main Results:

The nonmetrology-grade freeware program showed no inferiority to the metrology-grade software for overall RMS deviations (P<.05).
For marginal RMS deviations, the freeware was inferior only for PEEK frameworks scanned with the E4 laboratory scanner (P>.05).
This specific scanner-material pair (E4/PEEK) was the only instance of significant difference among 15 tested pairs.

Conclusions:

The tested nonmetrology-grade freeware program provides overall deviation measurements comparable to metrology-grade software.
The freeware's accuracy for marginal deviations is reliable across most scanner-material combinations.
Clinicians and technicians can consider this freeware for overall deviation analysis, with caution for marginal deviations in specific PEEK framework/scanner scenarios.