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Counting on the future: fast charge-integrating detectors for X-ray nanoimaging
Junjing Deng1, Antonino Miceli1, Chris Jacobsen1
1Advanced Photon Source, Argonne National Laboratory, Lemont, IL 60439, USA.
Abstract:
A fast charge-integrating detector has been showcased for high-resolution X-ray ptychography. The advancement in developing detectors of this kind, with rapid framing capabilities, holds paramount significance in harnessing the full potential of emerging diffraction-limited synchrotron sources for X-ray nanoimaging.
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