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Ultra-linear broadband optical frequency sweep for a long-range and centimeter-spatial-resolution OFDR
Optics Letters
|September 1, 2023
Summary
This study presents a novel optical frequency domain reflectometry (OFDR) system achieving centimeter-level spatial resolution over long distances. The system utilizes an ultra-linear broadband optical frequency sweep for precise strain sensing applications.
Area of Science:
- Photonics and Optical Sensing
- Metrology and Measurement Science
- Materials Science and Engineering
Background:
- Optical frequency domain reflectometry (OFDR) is crucial for high-resolution measurements.
- Achieving long-range and centimeter-spatial-resolution simultaneously in OFDR systems presents significant technical challenges.
- Nonlinear sweeping effects in lasers can degrade measurement accuracy and stability.
Purpose of the Study:
- To develop and demonstrate a long-range, centimeter-spatial-resolution OFDR system.
- To overcome limitations of nonlinear laser sweeping for stable, fast optical frequency sweeps.
- To validate the system's performance in distributed strain sensing applications.
Main Methods:
- Implemented an ultra-linear broadband optical frequency sweep using an optimized injection-locking system.
- Utilized a pre-distortion method to suppress nonlinear sweeping effects of distributed feedback (DFB) diode lasers.
- Achieved a high optical linear frequency sweep (LFS) with a 60 GHz range and 15 THz/s sweep rate.
Main Results:
- The developed OFDR system achieved a sampling spatial resolution of 1.71 mm.
- Demonstrated distributed strain sensing with high spatial resolutions of approximately 5 cm and 7 cm.
- Successfully performed measurements over extended ranges of 1 km and 2 km.
Conclusions:
- The proposed ultra-linear broadband optical frequency sweep enables high-performance OFDR.
- The system provides a robust solution for long-range, high-spatial-resolution distributed strain sensing.
- This advancement has significant implications for structural health monitoring and precision metrology.

