X-ray Crystallography
Lattice Centering and Coordination Number
X-ray Diffraction of Biological Samples
Crystal Field Theory - Tetrahedral and Square Planar Complexes
You might also read
Articles linked to this work by shared authors, journal, and citation graph.
Updated: Jul 17, 2025

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
Published on: May 28, 2016
Hilaire Mba1, Matthieu Picher1, Nathalie Daro2
1Institut de Physique et Chimie des Matériaux, UMR 7504, Université de Strasbourg, CNRS, 67034 Strasbourg, France.
Spin-crossover particles exhibit tilt boundaries, with defect structures remaining stable through numerous spin transitions. This stability is attributed to the crystal
Area of Science:
Background:
Purpose of the Study:
Main Methods:
Main Results:
Conclusions: