¹³C NMR: Distortionless Enhancement by Polarization Transfer (DEPT)
Transmission Electron Microscopy
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Updated: Jul 17, 2025

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
Published on: May 28, 2016
F Alanazi1, A S Eggeman2, K Stavrou1
1Department of Physics, Durham University, South Road, Durham DH1 3LE, U.K.
Structural disorder in molecular crystals limits charge mobility. Variable coherence transmission electron microscopy reveals thermal vibrations and static defects in pentacene films, offering insights into film fabrication effects on crystallinity.
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