Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Concept Videos

Electron Microscope Tomography and Single-particle Reconstruction01:07

Electron Microscope Tomography and Single-particle Reconstruction

2.4K
Transmission electron microscopy (TEM) can be used to determine the 3D structure of biological samples with the help of techniques such as electron microscope tomography and single-particle reconstruction. While single-particle reconstruction can examine macromolecules and macromolecular complexes in vitro conditions only, tomography permits the study of cell components or small cells in vivo.
Electron Tomography
Electron tomography can be performed either in TEM or STEM (scanning transmission...
2.4K
Atomic Emission Spectroscopy: Instrumentation01:22

Atomic Emission Spectroscopy: Instrumentation

520
The instrumentation of atomic emission spectrometry (AES) involves various components, including atomization devices that convert samples into gas-phase atoms and ions. There are two main types of atomization devices: continuous and discrete atomizers.  Continuous atomizers, like plasmas and flames, introduce samples in a constant stream, while discrete atomizers inject individual samples using syringes or autosamplers. The most common discrete atomizer is the electrothermal atomizer.
520
Overview of Microscopy Techniques01:22

Overview of Microscopy Techniques

10.4K
The early pioneers of microscopy opened a window into the invisible world of microorganisms. In 1830, Joseph Jackson Lister created an essentially modern light microscope. The 20th century saw the development of microscopes that leveraged nonvisible light, such as fluorescence microscopy that uses an ultraviolet light source and electron microscopy that uses short-wavelength electron beams. These advances significantly improved magnification, image resolution, and contrast. By comparison, the...
10.4K
Atomic Force Microscopy01:08

Atomic Force Microscopy

3.4K
Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
3.4K

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Valence-to-core X-ray emission spectroscopy of titanium compounds using energy dispersive detectors.

X-ray spectrometry : XRS·2024
Same author

Extreme Ultraviolet Radiation Pulsed Atom Probe Tomography of III-Nitride Semiconductor Materials.

The journal of physical chemistry. C, Nanomaterials and interfaces·2024
Same author

Atom probe tomography.

Nature reviews. Methods primers·2023
Same author

A Data-Driven Approach to Complex Voxel Predictions in Grayscale Digital Light Processing Additive Manufacturing Using U-Nets and Generative Adversarial Networks.

Small (Weinheim an der Bergstrasse, Germany)·2023
Same author

Tuning the photodynamics of sub-nanometer neutral chromium oxide clusters through sequential oxidation.

Nanoscale·2022
Same author

Orbital-dependent photodynamics of strongly correlated nickel oxide clusters.

Physical chemistry chemical physics : PCCP·2022
Same journal

Fiber-optic triggering of a two-stage high-current linear transformer driver with laser energy below 100 μJ.

The Review of scientific instruments·2026
Same journal

Optimization of laboratory-scale x-ray absorption spectroscopy (XAS) apparatus for nuclear fuel research.

The Review of scientific instruments·2026
Same journal

Compressed multi-scale entropy and its application in mechanical fault diagnosis.

The Review of scientific instruments·2026
Same journal

Bidirectional drive and multi-resolution adjustment across frequency bands in inertial impact piezoelectric motors via multimodal resonant vibration.

The Review of scientific instruments·2026
Same journal

A magnetic field sensor based on flaky Terfenol-D material and dual fiber grating.

The Review of scientific instruments·2026
Same journal

A novel E-field eight-way cavity combiner for high-power S-band applications.

The Review of scientific instruments·2026
See all related articles

Related Experiment Video

Updated: Jul 16, 2025

Atom Probe Tomography Analysis of Exsolved Mineral Phases
08:14

Atom Probe Tomography Analysis of Exsolved Mineral Phases

Published on: October 25, 2019

7.4K

Atom probe tomography using an extreme ultraviolet trigger pulse.

Benjamin W Caplins1, Ann N Chiaramonti1, Jacob M Garcia1

  • 1Applied Chemicals and Materials Division, National Institute of Standards and Technology, Boulder, Colorado 80305, USA.

The Review of Scientific Instruments
|September 13, 2023
PubMed
Summary
This summary is machine-generated.

Atom probe tomography (APT) now uses ultrafast extreme ultraviolet (EUV) pulses for field ion emission. This novel method enables atomic-resolution 3D material analysis, particularly for semiconductors and insulators.

More Related Videos

Imaging Replicative Domains in Ultrastructurally Preserved Chromatin by Electron Tomography
14:56

Imaging Replicative Domains in Ultrastructurally Preserved Chromatin by Electron Tomography

Published on: May 20, 2022

3.8K
Array Tomography Workflow for the Targeted Acquisition of Volume Information using Scanning Electron Microscopy
09:47

Array Tomography Workflow for the Targeted Acquisition of Volume Information using Scanning Electron Microscopy

Published on: July 15, 2021

4.9K

Related Experiment Videos

Last Updated: Jul 16, 2025

Atom Probe Tomography Analysis of Exsolved Mineral Phases
08:14

Atom Probe Tomography Analysis of Exsolved Mineral Phases

Published on: October 25, 2019

7.4K
Imaging Replicative Domains in Ultrastructurally Preserved Chromatin by Electron Tomography
14:56

Imaging Replicative Domains in Ultrastructurally Preserved Chromatin by Electron Tomography

Published on: May 20, 2022

3.8K
Array Tomography Workflow for the Targeted Acquisition of Volume Information using Scanning Electron Microscopy
09:47

Array Tomography Workflow for the Targeted Acquisition of Volume Information using Scanning Electron Microscopy

Published on: July 15, 2021

4.9K

Area of Science:

  • Materials Science
  • Physics
  • Analytical Chemistry

Background:

  • Atom probe tomography (APT) is a key technique for nanoscale materials analysis.
  • Conventional APT systems use visible or near-UV lasers for field ion evaporation.
  • Limitations exist in current laser-based triggering methods for certain materials.

Purpose of the Study:

  • To introduce and characterize an APT instrument utilizing ultrafast extreme ultraviolet (EUV) pulses.
  • To demonstrate the efficacy of EUV light in triggering field ion emission for materials analysis.
  • To detail the design and performance of the EUV beamline for APT applications.

Main Methods:

  • Generation of tunable EUV light (25-45 eV) using high harmonic generation in a noble-gas-filled capillary.
  • Delivery of EUV pulses to the APT specimen via a custom vacuum beamline.
  • Characterization of EUV spectrum, focus spot size, and long-term source stability.
  • Demonstration of APT analysis on semiconductors (Si, GaN) and insulators (Al2O3).

Main Results:

  • Successful generation and delivery of tunable EUV pulses to the APT specimen.
  • Characterization of the EUV beamline performance, including spectral evolution and focus spot size.
  • Demonstrated long-term stability of the EUV source (>1 year).
  • Successful field ion emission and APT analysis of Si, GaN, and Al2O3 using EUV pulses.

Conclusions:

  • Ultrafast EUV pulses are a viable and effective alternative for triggering field ion emission in APT.
  • This new method expands the applicability of APT to a wider range of materials, including insulators.
  • The developed EUV-based APT system offers a stable and high-performance solution for atomic-resolution 3D materials characterization.