Measurements of Strain
Stress-Strain Diagram
Thermal Strain
Three-Dimensional Analysis of Strain
True Stress and True Strain
Shearing Strain
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Updated: Jul 16, 2025

Micro/Nano-scale Strain Distribution Measurement from Sampling Moiré Fringes
Published on: May 23, 2017
Sangjun Kang1, Di Wang2, Christian Kübel3
1Institute of Nanotechnology (INT), Karlsruhe Institute of Technology (KIT), Eggenstein-Leopoldshafen 76344, Germany; Joint Research Laboratory Nanomaterials, Technical University of Darmstadt (TUDa), Darmstadt 64287, Germany.
Transmission electron microscopy (TEM) sample thickness is critical for accurate strain mapping. Thinning samples too much alters atomic structure, compromising the native deformation analysis.
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