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Related Concept Videos

Measurements of Strain01:27

Measurements of Strain

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Strain quantifies the deformation of a material under force, typically measured as normal strain, which represents the change in length when compared with the original length. Electrical strain gauges are used for enhanced accuracy. These devices consist of a conductive wire mounted on a paper backing that adheres to the material's surface. These gauges operate on the piezoresistive effect, where the wire's electrical resistance changes in response to mechanical deformation. The strain...
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A stress-strain diagram is a crucial tool that graphically displays a material's mechanical characteristics. This diagram is derived from a tensile test performed on a carefully prepared cylindrical specimen. The specimen has two gauge marks inscribed on its central part, and the distance between these marks is known as the gauge length. The cylindrical specimen is placed in a testing machine, which applies an increasing centric load. As this load grows, so does the gauge length. This...
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Thermal Strain01:19

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Thermal strain is a concept that arises when we consider how temperature changes affect structures. Unlike the conventional assumption that structures remain constant under load, real-world scenarios often involve temperature fluctuations that can significantly impact these structures. Consider a homogeneous rod with a uniform cross-section resting freely on a flat horizontal surface. If the rod's temperature increases, the rod elongates. This elongation is proportional to the temperature...
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Three-Dimensional Analysis of Strain01:29

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Three-dimensional strain analysis is crucial for understanding how materials deform under stress, particularly in elastic, homogeneous materials. This method employs principal stress axes to simplify complex stress states into more understandable forms. Subjected to stress, a small cubic element within a material either expands or contracts along these axes, transforming into a rectangular parallelepiped. This transformation effectively illustrates the material's deformation. The principal...
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True Stress and True Strain01:28

True Stress and True Strain

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Engineering stress is calculated as the load divided by the original, undeformed cross-sectional area. It approximates a material under load. This approximation is especially relevant post-yield in ductile materials. Though engineering stress-strain diagrams are often used for their convenience and accessibility, they can sometimes fall short in accuracy, particularly when dealing with large strain values.
In contrast, true stress offers a more precise portrayal. It is computed by dividing the...
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Shearing Strain01:20

Shearing Strain

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The shearing strain represents a cubic element's angular change when subjected to shearing stress. This type of stress can transform a cube into an oblique parallelepiped without influencing normal strains. The cubic element experiences a significant transformation when exposed solely to shearing stress. Its shape alters from a perfect cube into a rhomboid, clearly demonstrating the effect of shearing strain. The degree of this strain is considered positive if it reduces the angle between...
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Importance of TEM sample thickness for measuring strain fields.

Sangjun Kang1, Di Wang2, Christian Kübel3

  • 1Institute of Nanotechnology (INT), Karlsruhe Institute of Technology (KIT), Eggenstein-Leopoldshafen 76344, Germany; Joint Research Laboratory Nanomaterials, Technical University of Darmstadt (TUDa), Darmstadt 64287, Germany.

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Transmission electron microscopy (TEM) sample thickness is critical for accurate strain mapping. Thinning samples too much alters atomic structure, compromising the native deformation analysis.

Keywords:
4D-STEMFIB damageSample thicknessStrain mappingStrain relaxation

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Area of Science:

  • Materials Science
  • Condensed Matter Physics
  • Nanotechnology

Background:

  • Transmission electron microscopy (TEM) is vital for strain field analysis, offering high spatial resolution.
  • Thin specimens are standard in TEM to ensure electron transparency and minimize artifacts.
  • The impact of sample thinning on residual strain and atomic structure remains a key concern.

Purpose of the Study:

  • To systematically investigate how TEM sample thickness influences residual strain fields.
  • To quantify structural modifications induced by thinning in metallic glasses.
  • To determine the minimum required sample thickness for accurate strain measurements.

Main Methods:

  • Utilized Transmission electron microscopy (TEM) and 4D-STEM.
  • Examined deformed Fe-based and Zr-based metallic glasses.
  • Gradually thinned samples from 300 nm to 70 nm, analyzing the same area.

Main Results:

  • Sample thinning significantly affects atomic configurations at short-range (SR) and medium-range (MR) scales.
  • Excessive thinning leads to the loss of native deformation structure.
  • Residual strain fields are demonstrably altered by decreasing sample thickness.

Conclusions:

  • Sufficient sample thickness is crucial for preserving the native deformation structure in TEM analysis.
  • Inaccurate strain measurements can result from overly thin TEM samples.
  • Careful consideration of sample thickness is essential for reliable strain mapping using TEM.