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Collimation by a polycapillary half lens at 277 eV.

Jürgen Probst, Heike Löchel, Markus Thiel

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    |September 15, 2023
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    Summary
    This summary is machine-generated.

    A halved polycapillary lens (PCL) efficiently collimates 277 eV soft X-rays, achieving a low angular divergence. This advancement enhances photon flux density for soft X-ray metrology applications.

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    Area of Science:

    • Optics and Photonics
    • X-ray Optics
    • Materials Science

    Background:

    • Soft X-ray applications require precise beam control.
    • Polycapillary lenses (PCLs) are used for X-ray focusing and collimation.
    • Efficient collimation of low-energy soft X-rays presents a challenge.

    Purpose of the Study:

    • To demonstrate efficient collimation of soft X-rays using a halved polycapillary lens (PCL).
    • To characterize the angular divergence and intensity distribution of the collimated soft X-ray beam.
    • To assess the potential of halved PCLs for table-top metrology.

    Main Methods:

    • Utilized a halved polycapillary lens (PCL) made of borosilicate glass for soft X-ray collimation (277 eV).
    • Employed electron-excited, micro fluorescence emission in the PCL focus for experimental measurements.
    • Developed and used a novel ray tracing code for simulation and comparison.
    • Applied an analytical fit model to analyze the 3-D intensity distribution.

    Main Results:

    • Achieved an angular divergence of (6.9 ± 0.2) mrad in the far field of the emitted soft X-ray beam.
    • Simulations confirmed experimental results for a ≈5 μm source size.
    • Photon flux density was enhanced by a factor of ≈(30–90) compared to uncollimated radiation.
    • Characterized the evolution of the 3-D intensity distribution.

    Conclusions:

    • The halved polycapillary lens (PCL) is an effective tool for collimating soft X-rays.
    • The developed ray tracing code and analytical model accurately describe the beam characteristics.
    • Halved PCLs show promise as versatile components for table-top metrology of soft X-ray optical elements.