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Wavefront-splitting interferometer based on orbital angular momentum beams.

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    This study introduces a compact wavefront-splitting interferometer using orbital angular momentum (OAM) for precise nano-displacement measurements. The new OAM interferometer offers high accuracy and easy alignment, paving the way for miniaturized metrology devices.

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    Area of Science:

    • Optics and Photonics
    • Metrology
    • Nanotechnology

    Background:

    • Orbital angular momentum (OAM) interferometers are valuable in metrology but often suffer from large size and alignment difficulties.
    • Existing OAM interferometers limit practical applications due to their bulkiness.

    Purpose of the Study:

    • To propose and demonstrate a novel nano-displacement measurement system utilizing an OAM-based wavefront-splitting interferometer (WSI-OAM).
    • To overcome the size and alignment challenges associated with traditional OAM interferometers.

    Main Methods:

    • Development of a compact wavefront-splitting interferometer incorporating orbital angular momentum (WSI-OAM).
    • Experimental demonstration of the WSI-OAM system for nano-displacement measurement.

    Main Results:

    • Achieved a high resolution of 0.1 nm for nano-displacement measurement.
    • Obtained an uncertainty of 0.013 nm, with measurement accuracy exceeding 99.87% and linearity near 99%.

    Conclusions:

    • The developed WSI-OAM system provides a practical solution for miniaturizing and integrating OAM interferometers.
    • This technology offers a pathway for high-precision, compact metrology applications.