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Atomic Force Microscopy

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

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Surface Potential Measurement of Bacteria Using Kelvin Probe Force Microscopy

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Pulsed Force Kelvin Probe Force Microscopy through Integration of Lock-In Detection.

Amirhossein Zahmatkeshsaredorahi¹, Devon S Jakob¹, Hui Fang²

¹Department of Chemistry, Lehigh University, 6 East Packer Avenue, Bethlehem, Pennsylvania 18015, United States.

|September 22, 2023

Summary

A new lock-in amplifier method enhances pulsed force Kelvin probe force microscopy (PF-KPFM) for faster, simpler nanoscale electronic property measurements. This technique reveals differences in surface potential for two-dimensional materials and detects degradation in perovskite films.

Keywords:

KPFM MXenes correlative mapping kelvin probe force microscopy perovskite scanning probe microscopy surface potential

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Area of Science:

Materials Science
Surface Science
Nanotechnology

Background:

Kelvin probe force microscopy (KPFM) is crucial for analyzing nanoscale electronic properties like surface potential.
Pulsed force KPFM (PF-KPFM) offers high resolution but suffers from complexity and slow operation.
Existing methods struggle to reveal subtle electrical degradation in sensitive materials.

Purpose of the Study:

To develop a simplified and accelerated PF-KPFM technique.
To overcome the limitations of instrument complexity and operational speed in PF-KPFM.
To demonstrate the enhanced capabilities for analyzing electronic properties of advanced materials.

Main Methods:

Implementation of a lock-in amplifier with phase-synchronized field effect transistor switching.
Mediation of Coulombic force between the KPFM probe and sample.
Application to two-dimensional MXene and aged perovskite photovoltaic films.

Main Results:

The lock-in-based PF-KPFM method significantly reduces instrument complexity and increases operational speed.
Distinct contact potential differences (CPDs) were identified between monoflake and multiflake MXene.
Electrical degradation in perovskite films was detected, which was not visible through surface topography alone.

Conclusions:

The lock-in amplifier-based PF-KPFM provides a more accessible and efficient approach for nanoscale electronic characterization.
This technique offers valuable insights into material properties and degradation mechanisms.
It holds promise for advancing the study of 2D materials and organic electronics.