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Updated: Jul 15, 2025

Deep Learning-Based Segmentation of Cryo-Electron Tomograms
Published on: November 11, 2022
Jingrui Wei1, Ben Blaiszik2,3, Aristana Scourtas2,3
1Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, WI, USA.
We developed a benchmark dataset to evaluate neural network (NN) models for locating atomic columns in scanning transmission electron microscopy (STEM) images. Performance varies with image quality and data outside the training set.
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