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Updated: Jul 15, 2025

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Scanning Transmission Ion Microscopy Time-of-Flight Spectroscopy Using 20 keV Helium Ions

Michael Mousley1, Saba Tabean1,2, Olivier Bouton1

  • 1Advanced Instrumentation for Nano-Analytics (AINA) Group, Materials Research & Technology Department, Luxembourg Institute of Science and Technology, 41 Rue du Brill, Belvaux L-4422, Luxembourg.

Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
|September 25, 2023
PubMed

Keywords:
energy loss spectroscopyheliumtime of flighttransmission ion microscopy

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