Updated: Jul 15, 2025

Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station
Published on: April 1, 2020
Zhicheng Wang1,2, Junbo Feng3, Haitang Li4
1College of Artificial Intelligence, Southwest University, Chongqing 400715, China.
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Researchers developed a compact optical phased array (OPA) beam-splitting scheme using nano-inverse design. This innovation significantly reduces OPA size, enabling large-scale on-chip integration.
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