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Mirko Agarla1, Paolo Napoletano1, Raimondo Schettini1
1Dipartimento di Informatica, Sistemistica e Comunicazione, Università Milano-Bicocca, 20126 Milano, Italy.
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This study introduces a deep learning model for automated apple defect segmentation, improving accuracy and efficiency for agricultural quality control. The method achieves real-time performance and shows comparable results using standard RGB images.
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