Quasi Real-Time Apple Defect Segmentation Using Deep Learning

Mirko Agarla1, Paolo Napoletano1, Raimondo Schettini1

  • 1Dipartimento di Informatica, Sistemistica e Comunicazione, Università Milano-Bicocca, 20126 Milano, Italy.

Sensors (Basel, Switzerland)
|September 28, 2023
PubMed
Summary

This study introduces a deep learning model for automated apple defect segmentation, improving accuracy and efficiency for agricultural quality control. The method achieves real-time performance and shows comparable results using standard RGB images.