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TOF-SIMS study of latent fingerprints on challenging substrates with the aid of transfer films
Zhaolun Liu1, Wenjie Li2, Yin Wu1
1Department of Forensic Science, People's Security University of China, Beijing, 100038, People's Republic of China.
Abstract:
Time-of-flight secondary ion mass spectrometry (TOF-SIMS) has been applied in forensic science for fingerprint detection. However, due to limitations of the instrument, it is not always possible to directly sample fingerprints on certain substrates. In this report, we indirectly sampled fingerprints using transfer films. First, we optimized the experimental conditions and identified transfer films with better results. We then explored the feasibility of revealing fingerprints after transfer and successfully transferred and revealed the detailed features of fingerprints on several common objects that could not be directly sampled. Fingerprints transferred from smooth surfaces yield clearer feature details in ion images. Additionally, we analyzed the substances in the transferred fingerprints and detected components of morphine and MDMA(3,4-methylenedioxy-n-methylamphetamine). By combining feature details with identified chemical components, the identity of a person can be determined, linking suspects to the crime scene. This work provides a new approach for sample introduction in instrumental analysis, enabling TOF-SIMS to be applied in more scenarios.
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