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Updated: Jul 14, 2025

An Integrated Workflow of Identification and Quantification on FDR Control-Based Untargeted Metabolome
Published on: September 20, 2022
Knockoff procedure for false discovery rate control in high-dimensional data streams.
Ka Wai Tsang1, Fugee Tsung2, Zhihao Xu3
1School of Data Science, The Chinese University of Hong Kong, Shenzhen Guangdong 518172, People's Republic of China.
This study introduces a new Knockoff filtering procedure for identifying faulty data streams in statistical process control (SPC). The method effectively controls false discoveries while maintaining high power, even with limited out-of-control samples.
Area of Science:
- Statistics
- Industrial Engineering
- Data Science
Background:
- Root-cause identification in high-dimensional data streams is crucial for fault detection.
- Limited samples of out-of-control (OC) data streams pose challenges for traditional methods.
- Controlling false discoveries is essential for reliable fault identification in statistical process control (SPC).
Purpose of the Study:
- To propose a novel Knockoff procedure for multiple testing in multivariate SPC.
- To develop a method that combines with existing fault detection techniques without altering stopping times.
- To control the false discovery rate (FDR) in identifying OC data streams.
Main Methods:
- A Knockoff filtering procedure is proposed for multivariate SPC.
- The procedure is designed to integrate with other fault detection methods.
- Theoretical guarantees for FDR control are provided via a theorem.
Main Results:
- The proposed Knockoff procedure effectively controls the false discovery rate (FDR).
- The method demonstrates high statistical power in identifying faulty data streams.
- Simulation studies validate the performance and FDR control.
Conclusions:
- The Knockoff procedure offers a robust solution for fault identification in SPC with limited OC samples.
- This method enhances the reliability of fault detection in high-dimensional data streams.
- The approach is applicable to real-world scenarios, such as semiconductor manufacturing.
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